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A review of in-situ EBSD experiments
引用本文:Stuart I.WRIGHT,MatthewM.NOWELL. A review of in-situ EBSD experiments[J]. 中国体视学与图像分析, 2005, 10(4): 193-198
作者姓名:Stuart I.WRIGHT  MatthewM.NOWELL
作者单位:EDAX-TSL 392 East 12300 South,Suite H,Draper,EDAX-TSL,392 East 12300 South,Suite H,Draper,UT84020 USA,UT84020 USA
摘    要:IntroductionIn the firstautomated Electron Backscatter Diffrac-tion(EBSD)[1]or Orientation Imaging Microscopy(OIM)[2]systems,patterns were indexed at a rate ofabout four seconds per pattern.In the past decade,OIMscan speeds have increased to over 300 times fas-ter than the original measurements.During this sametime period,scanning electron microscope(SEM)technology has also seen large improvements enablingthe OIMtechnique to be applied at higher spatial reso-lutions and with more flex…

文章编号:1007-1482(2005)04-0193-06
修稿时间:2005-09-20

A review of in-situ EBSD experiments
Stuart I. WRIGHT,Matthew M. NOWELL. A review of in-situ EBSD experiments[J]. Chinese Journal of Stereology and Image Analysis, 2005, 10(4): 193-198
Authors:Stuart I. WRIGHT  Matthew M. NOWELL
Abstract:Automated EBSD or Orientation Imaging Microscopy(OIM) systems are being used in combination with other equipment within the scanning electron microscope(SEM) to perform in-situ measurements.This paper briefly reviews OIM studies of in-situ experiments performed using tensile and heating stages as well as in-situ serial sectioning.In particular,in-situ OIM scan results on an aluminum alloy sample deformed in tension;phase transformations in a cobalt sample,recrystallization and grain growth in a copper sample and serial sectioning of a nickel super-alloy sample are reviewed.
Keywords:EBSD  in-situ experiments  OIM
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