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Characterization of recast Nafion films by small- and wide-angle X-ray scattering
Authors:John Halim,Gü  nther G. Scherer,Manfred Stamm
Abstract:Room temperature recast Nafion
  • 1 General formula: chemical structure image
  • films, prepared under different humidities in the curing atmosphere, were characterized by small- and wide-angle X-ray scattering (SAXS and WAXS). SAXS reveals that the humidity influences the size of the ionic clusters in these polymer films. It was found that the number and size of ionic clusters increases with increasing relative humidity. WAXS indicates the presence of locally ordered regions of the backbone polymer. These results allow a qualitative understanding of the electrochemical behaviour of Nafion recast films cured at different humidities, as described in the literature.
    Keywords:
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