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Electron spectra derived from depth dose distributions
Authors:Faddegon B A  Blevis I
Institution:Toronto-Sunnybrook Regional Cancer Center, Ontario, Canada. Bruce.Faddegon@tsrcc.on.ca
Abstract:The technique of extracting electron energy spectra from measured distributions of dose along the central axis of clinical electron beams is explored in detail. Clinical spectra measured with this simple spectroscopy tool are shown to be sufficient in accuracy and resolution for use in Monte Carlo treatment planning. A set of monoenergetic depth dose curves of appropriate energy spacing, precalculated with Monte Carlo for a simple beam model, are unfolded from the measured depth dose curve. The beam model is comprised of a point electron and photon source placed in vacuum with a source-to-surface distance of 100 cm. Systematic error introduced by this model affects the calculated depth dose curve by no more than 2%/2 mm. The component of the dose due to treatment head bremsstrahlung, subtracted prior to unfolding, is estimated from the thin-target Schiff spectrum within 0.3% of the maximum total dose (from electrons and photons) on the beam axis. Optimal unfolding parameters are chosen, based on physical principles. Unfolding is done with the public-domain code FERDO. Comparisons were made to previously published spectra measured with magnetic spectroscopy and to spectra we calculated with Monte Carlo treatment head simulation. The approach gives smooth spectra with an average resolution for the 27 beams studied of 16+/-3% of the mean peak energy. The mean peak energy of the magnetic spectrometer spectra was calculated within 2% for the AECL T20 scanning beam accelerators, 3% for the Philips SL25 scattering foil based machine. The number of low energy electrons in Monte Carlo spectra is estimated by unfolding with an accuracy of 2%, relative to the total number of electrons in the beam. Central axis depth dose curves calculated from unfolded spectra are within 0.5%/0.5 mm of measured and simulated depth dose curves, except near the practical range, where 1%/1 mm errors are evident.
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