首页 | 本学科首页   官方微博 | 高级检索  
检索        

癫痫外科长程颅内电极埋置方法与安全陛探讨(附75例分析)
引用本文:蔡立新,李勇杰,张国君,杜薇.癫痫外科长程颅内电极埋置方法与安全陛探讨(附75例分析)[J].中国微侵袭神经外科杂志,2008,13(5):197-199.
作者姓名:蔡立新  李勇杰  张国君  杜薇
作者单位:首都医科大学宣武医院功能神经外科北京功能神经外科研究所,北京100053
摘    要:目的探讨提高癫痫外科长程颅内电极埋置手术安全性与成功率的方法及注意事项。方法回顾性分析210例接受癫痫手术病人行颅内皮质和(或)深部电极埋藏的经验,总结颅内电极埋置的适应证及术后出现的各种并发症。结果共75例(35.7%)病人采用术前长程颅内电极埋置手术。术后出现颅内血肿6例(8.0%),脑水肿6例(8.0%),感染7例(9.3%),脑脊液漏13例(17.3%),电极折断1例(1.3%)。病人无因并发症而放弃癫痫外科手术,亦无与电极埋置手术相关的长期并发症发生。结论颅内电极埋置术是癫痫外科中一项安全的侵袭性检查方法。术前认真制定手术方案,注意操作细节及技巧,将有助于避免并发症的发生。

关 键 词:癫痫  电极  植入  手术后并发症

Method and its safety of intracranial electrode implantations in epilepsy surgery: analysis of 75 cases
Institution:CAI Lixin, LI Yongjie, ZHANG Guojun, et al.( Department ofNeurosurgery, Beijing Institute of Functional Neurosurgery, Xuanwu Hospital, Capital University of Medical Sciences, Beijing 100053, China)
Abstract:Objective To explore the safety and cautions of the long-term intracranial electrode implantation in epilepsy surgery. Methods Experience in 210 patients undergoing intracranial cortex and (or) electrode implantation for long-term EEG recording before epilepsy surgery were reviewed retrospectively. The indications and complications of the electrode implantation were analyzed. Results Seventy-five patients (35.7%) received pre-surgical intracranial electrode implantations. Postoperative complications included intracranial hematoma in 6 cases (8.0%), brain edema in 6 (8.0%), central nervous system infection in 7 (9.3%), CSF leakage in 13 (17.3%), and electrode breaking in 1 (1.3%). There was no permanent deficit associated with intracranial studies and no patient finally gave up epilepsy surgery due to severe complication. Conclusion Intracranial electrode implantation is a safe invasive procedure before epilepsy surgery. The plan of the electrode implantations must be carefully made according to the results of noninvasive pre-surgical evaluation, besides, great attention should be paid to some cautions and operative skills.
Keywords:epilepsy  electrodes  implanted  postoperative complications
本文献已被 维普 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号