Resin-enamel bonds made with self-etching primers on ground enamel |
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Authors: | Hashimoto Masanori Ohno Hiroki Yoshida Eiji Hori Minoru Sano Hidehiko Kaga Masayuki Oguchi Haruhisa |
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Affiliation: | Division of Pediatric Dentistry, Hokkaido University, Graduate School of Dental Medicine, Sapporo, Hokkaido, Japan. masanori-h@mue.biglobe.ne.jp |
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Abstract: | Self-etching primer adhesives have recently been introduced to simplify bonding. However, the fundamental bonding mechanism of self-etching primers to enamel is not yet fully understood. This study aimed to investigate resin-enamel bonds of self-etching primer adhesives on ground enamel. Two self-etching primer adhesives (Clearfil Liner Bond 2 V and Clearfil SE Bond) were used in this study. A total-etch adhesive (One-Step) was used as a control. Resin-enamel beams were subjected to the microtensile bond test. Subsequently, the failure modes of all specimens were quantified using image analysis. Undemineralized and demineralized ultrathin sections of the resin-enamel bonded specimens were examined using transmission electron microscopy. The bond strengths of Clearfil SE Bond (39.8 +/- 11.9 MPa) and One-Step (46.2 +/- 12.7 MPa) were significantly greater than that of Clearfil Liner Bond 2V (30.4 +/- 6.2 MPa). Scanning electron microscopy of the fractured surfaces revealed the failure direction and weakest portion within each bond. Transmission electron microscopy showed a thin hybridized complex of resin in enamel produced by the self-etching primers without the usual micrometer-sized resin tags seen in resin-enamel bonds produced using the total-etch adhesive. The morphological features of the resin-enamel bonds produced by two self-etching primers tested were different from that created with the total-etch adhesive. |
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Keywords: | enamel self-etching primer fractography scanning electron microscopy (SEM) transmission electron microscopy (TEM) |
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