首页 | 本学科首页   官方微博 | 高级检索  
     

高分辨率磁共振成像应用于临床颅内动脉瘤风险评估的研究进展
引用本文:刘鹏,李佑祥,吕明. 高分辨率磁共振成像应用于临床颅内动脉瘤风险评估的研究进展[J]. 中国卒中杂志, 2018, 13(10): 1057-1062. DOI: 10.3969/j.issn.1673-5765.2018.10.011
作者姓名:刘鹏  李佑祥  吕明
作者单位:100050 北京首都医科大学附属北京天坛医院神经介入科;北京市神经外科研究所
摘    要:颅内动脉瘤发病机制仍未完全研究清楚,但血流动力学改变和炎症反应被认为在颅内动脉瘤的发生发展过程中扮演了重要角色。动脉瘤壁退行性改变则是上述因素作用的最终共同通路。目前临床上评价手段如计算机断层扫描血管成像、磁共振血管造影、数字减影血管造影,都是基于血流成像,无法反映动脉瘤壁的信息。近年来,随着磁共振设备场强逐渐增高以及分子对比剂的发展,高分辨率磁共振成像在评价血管炎症反应和滋养血管增生方面发挥越来越重要的作用。本文对高分辨率磁共振成像在评估颅内动脉瘤破裂风险中的相关进展进行了综述。

关 键 词:高分辨率磁共振成像  颅内动脉瘤  破裂风险  
收稿时间:2018-08-28

Application of High Resolution Magnetic Resonance Imaging in Risk Assessment of Intracranial Aneurysms Rupture
LIU Peng,LI You-Xiang,LYU Ming. Application of High Resolution Magnetic Resonance Imaging in Risk Assessment of Intracranial Aneurysms Rupture[J]. Chinese Journal of Stroke, 2018, 13(10): 1057-1062. DOI: 10.3969/j.issn.1673-5765.2018.10.011
Authors:LIU Peng  LI You-Xiang  LYU Ming
Abstract:Although the pathogenesis of intracranial aneurysms remains unclear, the
hemodynamic changes and inflammation may play an important role in the evolution process
of intracranial aneurysms. The degeneration of aneurysmal wall is the final common pathway of
various influencing factors. Currently clinical evaluation methods, such as computed tomography
angiography, magnetic resonance angiography, digital subtraction angiography, which are based on
the imaging of blood flow, can not reflect the architectural details of aneurysm wall. In recent years,
with the development of magnetic resonance equipment and field strength, as well as molecular
contrast agents, high resolution magnetic resonance imaging (HR-MRI) plays an increasingly
important role in evaluating vascular inflammation and nourishing vascular proliferation. This
article reviewed the progress of HR-MRI was applied in assessing the risk of intracranial aneurysms
rupture.
Keywords:High resolution magnetic resonance imaging  Intracranial aneurysm  Rupture risk  
本文献已被 CNKI 等数据库收录!
点击此处可从《中国卒中杂志》浏览原始摘要信息
点击此处可从《中国卒中杂志》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号