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Stimulus artefact in somatosensory evoked potential measurement
Authors:Professor R. N. Scott  L. McLean  P. A. Parker
Affiliation:(1) Institute of Biomedical Engineering and Department of Electrical Engineering, University of New Brunswick, E3B 5A3 Fredericton, NB, Canada
Abstract:When an electrical stimulus is used to evoke action potentials in peripheral nerves or the spinal cord, the stimulus causes an artefact which may interfere with measurement of the evoked potentials. This artefact, unlike all other sources of noise in the measurement, cannot be reduced by ensemble averaging. Confusion about the origin and transmission of stimulus artefact has led to considerable frustration in spinal somatosensory evoked potential (SSEP) measurements. The three mechanisms by which stimulus artefact is coupled into the measuring system are identified, and means for their reduction are discussed.
Keywords:Stimulus artefact  Evoked potentials  SSEP measurement
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