| 测量断口分维的一种变分辨率码尺方法 |
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| 引用本文： | 李启楷,张跃,褚武扬,王琛,白春礼.测量断口分维的一种变分辨率码尺方法[J].中国体视学与图像分析,1999(1). |
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| 作者姓名： | 李启楷 张跃 褚武扬 王琛 白春礼 |
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| 作者单位： | 北京科技大学材料物理系，中国科学院化学研究所 |
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| 基金项目： | 国家自然科学基金,冶金工业部基础基金 |
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| 摘 要： | 本文提出了测量断口分维的一种变分辨率码尺方法，并利用ＷｅｉｅｒｓｔｒａｓＭａｎｄｅｌｂｒｏｔ理论分形曲线对变分辨率码尺方法与传统的变码尺方法进行了对比。结果表明，变分辨率码尺方法优于传统的变码尺方法。用扫描隧道显微镜（ＳＴＭ）利用变分辨率码尺方法在纳米尺度测定了Ｔｉ３ＡｌＴｉ２４Ａｌ１１Ｎｂ合金断口的分形维数。发现断裂表面在纳米尺度上存在分形结构，但不同断裂方向的分形维数不同：Ｔｉ２４Ａｌ１１Ｎｂ合金的分形维数高于Ｔｉ３Ａｌ合金的分形维数
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| 关 键 词： | 分维 纳米尺度 变分辨率码尺方法 钛铝合金 |
A new yard-stick method for fractal dimension determination by varying instrumental resolution |
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| Li Qikai,Zhang Yue,Chu Wuyang,Wang Chen,Bai Chunli.A new yard-stick method for fractal dimension determination by varying instrumental resolution[J].Chinese Journal of Stereology and Image Analysis,1999(1). |
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| Authors: | Li Qikai Zhang Yue Chu Wuyang Wang Chen Bai Chunli |
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| Institution: | Li Qikai 1 Zhang Yue 1 Chu Wuyang 1 Wang Chen 2 Bai Chunli 2 |
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| Abstract: | A new -stick method by varying instrumental resolution for determining the fractal dimension was proposed. Weierstrass-Mandelbrot fractal curves was used to verify the accuracy and reliability. Computer simulation showed that the fractal dimension obtained with yard stick method by varying instrumental resolution generally out runs the traditional yard-stick method.The new method has been applied to fractal dimension determination of the fractures of alloys Ti3Al and Ti 24Al 11Nb with STM at nanometer scale. Results showed that the fractal dimensions of Ti 24Al 11Nb alloy are higher than those of Ti3Al,and the rfactal dimensions vary with the directions as to crack orientation. |
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| Keywords: | fractal dimension nanoscale varying instrumental resolution Ti3 Al alloy |
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