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Comparison of migration behavior between single and dual lag screw implants for intertrochanteric fracture fixation |
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| Authors: | George K Kouvidis Mark B Sommers Peter V Giannoudis Pavlos G Katonis Michael Bottlang |
| Affiliation: | (1) Department of Orthopaedic Surgery and Traumatology, University Of Crete, Heraklion, Greece;(2) Biomechanics Laboratory, Legacy Research & Technology Center, Portland, Oregon 97215, USA;(3) Trauma & Orthopaedic Surgery School Of Medicine, University of Leeds, Leeds General Infirmary, Great George Street, Leeds, LS1 3EX, UK |
| Abstract: | BackgroundLag screw cut-out failure following fixation of unstable intertrochanteric fractures in osteoporotic bone remains an unsolved challenge. This study tested if resistance to cut-out failure can be improved by using a dual lag screw implant in place of a single lag screw implant. Migration behavior and cut-out resistance of a single and a dual lag screw implant were comparatively evaluated in surrogate specimens using an established laboratory model of hip screw cut-out failure. |
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