首页 | 本学科首页   官方微博 | 高级检索  
检索        

扫描电镜观察漂白剂对牙釉质和牙本质结构的影响
引用本文:王春兰,董亚利.扫描电镜观察漂白剂对牙釉质和牙本质结构的影响[J].天津医科大学学报,2001,7(1):71-74.
作者姓名:王春兰  董亚利
作者单位:1. 天津医科大学第二医院口腔科,
2. 天津医科大学电镜室,
摘    要:目的:观察不同浓度漂白剂治疗牙釉质,牙本质后超策结构的变化,方法:分别用30%过氧化氢(1)组,16%过氧化脲(3)组对离体牙牙釉 质及牙本质进行6d治疗,SEM下观察,结果:(1)组牙釉质脱矿明显,牙本质因脱矿见有胶原纤维网架显露。(2_组釉质因脱矿晶体微细结构不清晰,牙本质内见有局灶性钙化减低灶。(3)组釉柱排列整齐无脱矿,牙本质内有局灶性钙化减低区,结论:高浓度过氧化氢可龠上釉质及牙本质表层脱矿部分结构遭到破坏,提示临床应用低浓度漂白剂安全,有效。

关 键 词:过氧化氢  过氧化脲  超微结构脱矿化  漂白剂  牙釉质  牙本质
文章编号:1006-8147(2001)01-0071-04
修稿时间:2000年8月30日

Scanning electron microscope study on the effect of bleaching agents on the morphology of human enamel and dentin
WANG Chun-lan,Dong Ya-Li.Scanning electron microscope study on the effect of bleaching agents on the morphology of human enamel and dentin[J].Journal of Tianjin Medical University,2001,7(1):71-74.
Authors:WANG Chun-lan  Dong Ya-Li
Institution:WANG Chun - Lan1,Dong Ya - Li 2
Abstract:Objective:To the ultrastructure changes of the morphology of enamel and dentin teeth after treated with different concentration of bleaching agents.Methods: Teeth were just extracted and then treated with 30% hydrogen peroxide(1)group, 16% carbamide peroxide(2)grpup,and 11% carbamide peroxide(3)group respectively for six days.The morphology of enamel and dentin of each tooth were evaluated undera scanning electron microscope.Results:(1)group,Some enamel crystals had obvious demineralization.Collagenfiber was exposured due to dentin dmineralization.In(2)group port of the texture of enamel crystals were not distinct due to demineralization.Foci of decalcification of dentin was found in SEM.In(3) group,enarnel rods were regular arranged and high mineralization dentin had scattered foci of decalcification.Conclusion:The high concentration of bleaching agents demineralized enamel and dentin and some texture of them were destroyed.The result showed the lower concentration of bleaching agents is a safe and effective agent for clinical application.
Keywords:Hydrogen peroxide  Carbamide  Peroxide  Ultrastructure  Demineralization  
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号