Development of a low-level background gamma-ray spectrometer by KRISS |
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Authors: | K.B. Lee Tae Soon Park Jong Man Lee Phil-Je Oh Sang-Han Lee |
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Affiliation: | aKorea Research Institute of Standards and Science, Daejeon 305-600, Republic of Korea |
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Abstract: | A new low-level background and high-efficiency gamma-ray spectrometric system, to be used mainly for the activity certification of natural-matrix certified reference materials (CRMs) and environmental reference materials (RMs) that has been developed on the grounds of the Korea Research Institute of Standards and Science (KRISS). The spectrometer consists of a low-background high-purity germanium detector with a relative efficiency of 120% and various shielding devices to reduce radiation background. The cabinet-shaped device made of 10 ton of shielding materials encloses the germanium detector for protection against background from natural radioactivity and neutrons. Three plates of 50-mm-thick plastic scintillation detectors on top of the passive shielding cabinet suppress cosmogenic background by detecting high-energetic cosmic muons bombarding the germanium detector. The measured background rate of the spectrometer for the energy range 50–3000 keV was 1.72 s–1. |
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Keywords: | Gamma-ray spectrometer Low-level background Background reduction Anticoincidence shield |
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