Risk factors for thirty‐day readmission following flap reconstruction of oncologic defects of the head and neck期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Risk factors for thirty‐day readmission following flap reconstruction of oncologic defects of the head and neck

Authors:	Heather A. Osborn MD Vinay K. Rathi MD Tjoson Tjoa MD Neerav Goyal MD Bharat B. Yarlagadda MD Debbie L. Rich RN Kevin S. Emerick MD Derrick T. Lin MD Daniel G. Deschler MD Marlene L. Durand MD

Affiliation:	1. Department of Otolaryngology, Massachusetts Eye and Ear Infirmary, Boston, Massachusetts;2. Department of Otolaryngology, University of California, Irvine, California;3. Penn State Milton S. Hershey Medical Center, Division of Otolaryngology Head and Neck Surgery, Hershey, Pennsylvania;4. Department of Otolaryngology, Lahey Hospital and Medical Center, Burlington, Massachusetts;5. Department of Nursing, Massachusetts Eye and Ear Infirmary, Boston, Massachusetts;6. Department of Medicine, Infectious Disease Unit, Massachusetts General Hospital and Infectious Disease Service, Massachusetts Eye and Ear Infirmary, Boston, Massachusetts

Abstract:

Keywords:	Readmission oncology head and neck surgery head and neck oncology free flap free tissue reconstruction surgical site infection