正常及光感受器损伤兔眼视网膜下芯片植入后的电生理结果

目的 观察视网膜下芯片所引起的光感受器损伤及正常兔眼的电生理改变。 方法 青紫蓝兔共30只，其中22只兔NaIO3生理盐水溶液静脉 注入后眼光感受器受到损伤。将一个由90个微光电二极管组成的阵列和相连电极构成的直径约3mm的芯片通过巩膜切口植入4只正常及22只注药后光感受器损伤兔右眼的视网膜下腔或脉络膜中，左眼为对照眼 ；分别检测芯片眼及对照眼局部闪光视觉诱发电位（F-VEP）、局部闪光视网膜电图（F-ERG）、全视野闪光VEP及全视野闪光ERG。另外4只兔双眼摘作病理检查。 结果 22只色光感受器损伤兔中有11只芯片眼的局部ERG主波振幅明显大于对照眼；4只正常兔中，2只芯片眼的局部ERG主波振幅大于对照眼。1只芯片眼表面视网膜出现破孔不能引出任何波。局部VEP及全视野闪光VEP重复性较差，全视野闪光ERG未见明确差别。 结论 植入的芯片在受到光刺激 后可刺激局部视网膜并引起局部视网膜的电活动。 (中华眼底病杂志, 2006, 22: 324-327)

Electrophysiological response in rabbits with normal and injured photoreceptor due to subretinal implantation of chip

Objective To observe the changes of electrophysiological results in rabbits with normal and injured photoreceptor due to subretinal implantation of chip. Methods Photoreceptor damage was induced by injection with NaIO_3 solution in 22 out of 30 rabbits. A chip with the diameter of 3 mm made by the array composed of 90 microelectrodes photodiode and conjoint electrode was implanted into subretinal space or choroid of the right eyes of 22 rabbits with photoreceptor and 4 normal rabbits, and the left eyes were the control. The examinations of local flash-visual evoked potential (F-VEP), local flash-electroretinogram (F-ERG), full-field F-ERG and full-filed F-VEP were measured respectively.Another 4 rabbits underwent biocular extirpation for pathological examination Results In 22 rabbits with photo- receptor damage, the amplitude of the main wave of local ERG was obviously higher in 11 eyes with chips than that in the control ones, and was also higher in 2 eyes with chips of the 4 mormal rabbits than that in the control eyes. No wave was found in an eye with retinal hole on the surface of the chip. The repeataility of main amplitude of local-VEP and full-field F-VEP is not satisfactory; no significant changes were observed between chip-implanted eyes and the control eyes examined by full-filed F-ERG. Conclusion The implanted chip may stimulate local retina and induce electrical activities after stimulated by light.