| Abstract: | The relative sensitivity of the half-value layer (HVL) method as a quality index for megavoltage x-ray beams is examined by theoretical calculation and experimental measurements for 4-, 6-, 10-, and 25-MV x-ray beams. It is shown that lower atomic number materials are more sensitive to beam quality changes than higher atomic number materials, and that aluminum is a reasonable choice of material for HVL measurements in megavoltage x-ray beams. Further, it was found that the HVL in aluminum or polystyrene is a more sensitive index of spectral quality than the ionization ratio method, recommended by recent dosimetry protocols. |
