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Postoperative Left Ventricular Mass Regression After Aortic Valve Replacement for Aortic Stenosis
Authors:Hiroshi Tomoeda  Tomohiro Ueda  Hideki Teshima  Koichi Arinaga  Keiichiro Tayama  Shuji Fukunaga  Shigeaki Aoyagi
Affiliation:a Department of Surgery, Kurume University Hospital, Kurume, Fukuoka, Japan
b Department of Cardiovascular Surgery, Munakata General Hospital, Fukutsu, Fukuoka, Japan
Abstract:
Keywords:AS, aortic stenosis   AVR, aortic valve replacement   BSA, body surface area   CP, catheter pressure   CPG, the pressure gradient across the aortic valve   EOA, effective orifice area   EOAI, effective orifice area index   IVST, intraventricular septum thickness   LV, left ventricular   LVDd, end-diastolic left ventricular diameter   LVDs, end-systolic left ventricular diameter   LVM, left ventricular mass   NYHA, New York Heart Association   pPG, peak pressure gradient   PPM, prosthetic patient mismatch   PWT, posterior wall thickness   SysBP, lowest value of the systolic pressure   VDh, highness of the left ventricle   VDs, ventricular basal diameters
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