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不同树脂修复黏结界面及表面超微结构研究
引用本文:陈亚明,冯海兰,梅蕾,孙亚洲.不同树脂修复黏结界面及表面超微结构研究[J].实用口腔医学杂志,2007,23(2):220-223.
作者姓名:陈亚明  冯海兰  梅蕾  孙亚洲
作者单位:1. 南京医科大学口腔医学院,210029
2. 北京大学口腔医学院,100081
3. 南京医科大学口腔医学院修复学教研室,210029
摘    要:目的:研究复合树脂、树脂黏结剂与牙体界面超微结构,评价不同处理以及不同树脂修复方法的效果。方法:选用不同复合树脂、刚拔除的离体磨牙制作试样,在扫描电镜和原子力显微镜下观察分析:A组.Renew直接充填;B组.Renew树脂嵌体;C组.Tescera树脂嵌体。结果:复合树脂Tescera材料的图像特征为结构比较致密,与Renew树脂相比,结构内部的孔隙较少,原子力显微镜图象表明该材料表面的粗糙度很低,表面光滑平整。Tescera树脂可以与树脂黏结剂完全密合、相互渗透,而Renew树脂嵌体材料与树脂黏结剂界面清楚,没有明显的融合渗透现象。结论:经过水、热、光、压力综合处理Tescera树脂材料可以有效地提高材料物理性能,并与黏结剂的界面有更好的融合现象。

关 键 词:扫描电镜  原子力显微镜  复合树脂  黏结界面  超微结构
文章编号:1001-3733(2007)-02-0220-04
修稿时间:2006-04-15

Study on bonding interface and microstructure of different resin composite inlays
Chen Yarning, Feng Hailan, Mei Lei,et al..Study on bonding interface and microstructure of different resin composite inlays[J].Journal of Practical Stomatology,2007,23(2):220-223.
Authors:Chen Yarning  Feng Hailan  Mei Lei  
Institution:School of Stomatology, Peking University, Beijing 100081 , China
Abstract:Objective:To evaluate the characteristics of bonding interface and microstructure of different resin composite inlays. Methods:Different composite resins and adhesives were used for restoration of extracted molars, the results were evaluated under scanning electron microscope(SEM) and atomic force microscope(AFM).Results:The microstructure feature of Tescera was with higher density when compared with that of other conventional resins,and fewer small holes could be seen in Tescera. AFM pictures showed that Tescera was with a very smooth surface. Indirect composite resin could be combined with resin bonding agent tightly and infiltrated each other. The interface between direct resin inlay material and resin bonding agent was very clear,and no obvious interfiltration could be seen under SEM and AFM. Conclusion:After treatment with water, heat,light and pressure, the physical properties of indirect composite resin is improved effectively, and obvious infiltration can be found in the interface.
Keywords:Scaning electron microscope(SEM)  Atomic force microscope(AFM)  Composite resin  Bonding interface  Microstructure
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