首页 | 本学科首页   官方微博 | 高级检索  
     

三维分析仪与两维矩阵射野测量的比较
引用本文:雷宏昌,李定杰,孟令广,马蕾杰. 三维分析仪与两维矩阵射野测量的比较[J]. 中国医学物理学杂志, 2011, 28(4): 2722-2724. DOI: 10.3969/j.issn.1005-202X.2011.04.005
作者姓名:雷宏昌  李定杰  孟令广  马蕾杰
作者单位:郑州大学附属肿瘤医院河南省肿瘤医院,河南郑州,450003
摘    要:目的:应用不同仪器与方法测量加速器6 MV X线射野的特性,比较各方法的优劣和局限性,探讨快速简便检测射野特性的方法。材料与方法:分别采用电离室和半导体探头配合三维射野分析仪测量加速器6 MV X线不同射野大小的百分深度剂量曲线PDD和离轴比曲线OCR,并以二维电离室矩阵测量相同条件的OCR。(1)比较采用电离室和半导体探头测量PDD的差别。(2)比较两维矩阵与电离室半导体探头测量射野的对称性、平坦度、射野大小和半影等的差别。结果:对小于15 cm×15 cm照射野,半导体探头和电离室测量PDD的结果一致性较好,两者偏差小于1.3%。对于20 cm×20 cm照射野,半导体探头的测量结果大于电离室,最大差别3.5%,偏差为2.6%。用半导体探头与电离室测量射野的大小,两者的最大差别为0.6 mm,两者有较好的一致性,二维电离室矩阵测量与前两者比较,最大差别为2.9 mm,最小差别0.5 mm。三种方法测量的射野平坦度差别在1.2%~2.6%,矩阵的测量数值在半导体和电离室测量范围之内。结论:在检测加速器射野性能时,二维矩阵可以快速检测射野平坦度、对称性,但测量射野大小时可能有较大误差,不宜用作验收加速器和收集...

关 键 词:二维矩阵  电离室  半导体  照射野

Comparison of Radiation Field Measured by Using Three-dimensional Analysis Device and Two-dimensional Matrix
LEI Hong-chang,LI Ding-jie,MENG Ling-guang,MA Lei-jie. Comparison of Radiation Field Measured by Using Three-dimensional Analysis Device and Two-dimensional Matrix[J]. Chinese Journal of Medical Physics, 2011, 28(4): 2722-2724. DOI: 10.3969/j.issn.1005-202X.2011.04.005
Authors:LEI Hong-chang  LI Ding-jie  MENG Ling-guang  MA Lei-jie
Affiliation:LEI Hong-chang,LI Ding-jie,MENG Ling-guang,MA Lei-jie(The Affiliated Cancer Hospital of Zhengzhou University,Cancer Hospital of Henan Province,Zhengzhou Henan 450003,China)
Abstract:Objective: To study the characteristics of 6 MV X-ray radiation field through comparison of radiation field measured by using different methods and devices.Materials and Methods: We adopt ionization chamber and diode detector with three dimensional analysis devices to measure 6 MV X-ray PDD curve and OCR profile of different radiation fields.(1) Compare the differences of PDD curve respectively measured by using ionization chamber and diode detector.(2) Compare the differences of symmetry,flatness and penum...
Keywords:two dimensional matrix  ionization chamber  semiconductor  radiation field  
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号