Portable x-ray diagnostic equipment

Scientific-Industrial Association “Spektr”, Moscow. Translated from Meditsinskaya Tekhnika, No. 4, pp. 22–28, July–August, 1992.     

Update on domestic x-ray diagnostic equipment

All-Russian Scientific-Research and Testing Institute for Medical Engineering, Moscow. Translated from Meditsinskaya Tekhnika, No. 2, pp. 37–39, March–April, 1995.     

Quality assurance of equipment in x-ray diagnostic departments

Scientific-Industrial Association Ékran, Moscow. Translated from Meditsinskaya Tekhnika, No. 3, pp. 8–10, May–June, 1992.     

Developing a regulatory system for x-ray diagnostic equipment

Moscow Scientific Radiological Research Institute, Ministry of Health of the RSFSR, Moscow. Translated from Meditsinskaya Tekhnika, No. 5, pp. 35–39, September–October, 1991.     

Approaches and problems in the development of x-ray diagnostic equipment

ékran Scientific-Production Association. Spektr Scientific-Production Association. Moscow Scientific Radiological Research Institute, Ministry of Health of the RSFSR. Translated from Meditsinskaya Tekhnika, No. 5, pp. 7–11, September–October, 1991.     

Ionometric x-ray diagnostic devices

Scientific-Research Institute for Introscopy, Moscow. Moscow Scientific-Research Institute for Diagnostics and Surgery. Translated from Meditsinskaya Tekhnika, No. 3, pp. 29–31, May–June, 1995.     

CdZnTe detector in diagnostic x-ray spectroscopy

A method to utilize CdZnTe (CZT) detectors in diagnostic x-ray spectroscopy is described in this article. Spectral distortion due to transmission of primary x rays, the escape of cadmium- and tellurium-K fluorescent x rays, and tailing was severe in measured x-ray spectra. Therefore, correction for the distortion was performed with the stripping method using response functions. The response functions were calculated with the Monte Carlo method. The Hecht equation was employed to approximate the effects of carrier trapping in the calculations. The parameters in the Hecht equation, the mean-free path (lambda) of electrons and holes, were determined such that the tailing in calculated response functions fit that in measured gamma-ray spectra. Corrected x-ray spectra agreed well with the reference spectra measured with an HPGe detector. The results indicate that CZT detectors are suitable for diagnostic x-ray spectroscopy with appropriate corrections.     

Thin CdTe detector in diagnostic x-ray spectroscopy

A CdTe Schottky diode detector of 1 mm thickness was employed in diagnostic x-ray spectroscopy. The detector response to monoenergetic photons was investigated with gamma rays from the calibration sources (241Am and 133Ba). As spectral distortion due to carrier trapping, known as tailing, was small in gamma-ray spectra, the effects of carrier trapping were not taken into account in the calculation of response functions. The distortion due to the transmission of primary x rays and the escape of secondary x rays (K-fluorescent x rays and Compton-scattered x rays) from the crystal was included in the calculated response functions. X-ray spectra corrected using the response functions were in good agreement with the reference spectra obtained with a high-purity germanium detector. The results indicated that correction for the distortion due to carrier trapping is not necessary when using a thin CdTe detector in diagnostic x-ray spectroscopy.