|
|||||
|
|
Reassessing Risk Factors for High Defibrillation Threshold: The EF‐SAGA Risk Score and Implications for Device Testing |
|
| Authors: | MICHAEL J. SHIH M.D. M.Sc. SIDDHARTH A. KAKODKAR M.D. YOUSEF KAID M.D. JONATHAN L. HASSEL M.D. SANTI YARLAGADDA M.D. LOUIS F. FOGG Ph.D. CHRISTOPHER MADIAS M.D. KOUSIK KRISHNAN M.D. RICHARD G. TROHMAN M.D. M.B.A. |
| Affiliation: | Department of Medicine, Division of Cardiology, Electrophysiology, Arrhythmia and Pacemaker Service, Rush University Medical Center, Chicago, Illinois |
| Abstract: | |
| Keywords: | defibrillation function threshold testing safety margin testing device testing |