首页 | 本学科首页   官方微博 | 高级检索  
     


Chronological changes of MRI findings on striatal damage after acute cyanide intoxication: Pathogenesis of the damage and its selectivity,and prevention for neurological sequelae: A case report
Authors:Kimihiro Kasamo  Yoshitaka Okuhata  Ryuji Satoh  Mori Ikeda  Sakae Takahashi  Rikisaburo Kamata  Yoshimi Nogami  Takuya Kojima
Affiliation:(1) Department of Neuropsychiatry, Nihon University School of Medicine, 30-1 Oyaguchi Kamimachi Itabashi-ku, 173 Tokyo, Japan;(2) Department of Radiology, Nihon University School of Medicine, 30-1 Oyaguchi Kamimachi Itabashi-ku, 173 Tokyo, Japan
Abstract:
Summary A 31-year-old male technician in an electroplating factory, who had been suffering from the temporal lobe epilepsy for 24 years and from hypertension for 3 years, took an unknown amount of potassium cyanide apparently over the lethal dose, in an attempt to commit suicide. He was treated successfully and survived without any neurological sequelae. The electroencephalograms and the nature of the seizures were not different before and after the poisoning. The T2-weighted magnetic resonance images at 9 and 51 days after the poisoning showed bilateral elevation of signals in the caudate nuclei and the putamina. At the 143th and 286th days, T2-weighted high-resonance areas were restricted to the lateral portion of the putamina. The T1-weighted images at the 51st day showed abnormal signal elevations in both putamina, while those of 9th, 143th and 286th days were mainly normal. Selective vulnerability of the putamen and the caudate nucleus may be due to their specific structural properties of high oxygen and glucose utilization, and enzyme distribution. Both chronological changes of striatal damage and the absence of neurological sequelae in this patient suggest the possibility that anti-epileptics and a calcium antagonist played a neuroprotective role in the acute cyanide intoxication.
Keywords:Cyanide  basal ganglia  anti-epileptic drugs  calcium antagonist  MRI
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号