腭部种植体支抗稳定性的临床研究

目的评价腭部种植体支抗系统在临床固定矫治技术正畸治疗中的稳定性。方法将直径5.0mm、长6mm的种植体植入19例错畸形患者上颌前磨牙区腭中缝的硬腭,愈合期4周,以横腭杆连接上颌双侧磨牙和种植体作为强支抗,配合MBT矫治技术常规减数正畸治疗。对种植体植入时和支抗作用完成种植体取出前的头影测量指标进行配对比较。结果本组腭部种植体支抗成功率为84.3%,16颗种植体在口内行使功能的时间10～36个月,平均为(23.08±8.06)个月。种植体植入到种植体取出,IL-X轴分别为(62.88±5.85)mm和(62.45±6.70)mm,IL-Y轴为(36.66±5.41)mm和(37.96±4.90)mm,IAP-PP为(73.81±8.84)°和(74.72±9.22)°,IAP-Y轴为(62.09±9.33)°和(63.85±10.96)°,U6-Y轴为(20.80±5.87)mm和(21.49±6.00)mm,经配对t检验,差异均无统计学意义。结论腭部种植体支抗种植系统承载临床正畸力能保持稳定,从而起到增强磨牙支抗作用。

Clinical study on the stability of palatal implant anchorage

OBJECTIVE: To evaluate the clinical stability of the palatal implant anchorage system in orthodontic treatment. METHODS: Sixteen osseointegrated implants (5.0 mm in diameter, 6 mm length) were inserted in the median palatal suture area of 19 patients with malocclusion (average age: 18.22 +/- 7.10 years, from 11 years to 35 years 1 month) as anchorage of active orthodontic treatment with MBT appliance. The standard lateral cephalogram after implant placement and before implant removing was taken to compare the radiological parameters. RESULTS: The successful rate of palatal implant anchorage was 84.2%. The average duration of 16 palatal implant was 23.08 +/- 8.06 months (from 10 months to 36 months). There were no statistical differences in all parameters from the implant placement to the end of treatment. IL-X was from (62.88 +/- 5.85) mm to (62.45 +/- 6.70) mm, IL-Y was from (36.66 +/- 5.41) mm to (37.96 +/- 4.90) mm, IAP-PP was from (73.81 +/- 8.84) degrees to (74.72 +/- 9.22) degrees, IAP-Y was from (62.09 +/- 9.33) degrees to (63.85 +/- 10.96) degrees, U6-Y is from (20.80 +/- 5.87) mm to (21.49 +/- 6.00) mm. CONCLUSIONS: Stable palatal implant anchorage was maintained during active orthodontic treatment.