大鼠额叶皮质损害的脑电功率谱和形态学研究

３５只ＳＤ大鼠随机分成三组：正常组、假损害组和损害组。采用机械抽吸法制作大鼠右侧额叶皮质损害模型。对各组大鼠分别进行脑电功率谱分析和比较．结果发现：正常大鼠和假损害大鼠两侧大脑半球δ、θ、α和β频段相对功率值相近似（Ｐ＞０．０５），ＤＴ／ＡＢ值（即δ＋θ／α＋β的绝对功率值之比）也相似（Ｐ＞０．０５），功率谱曲线两侧基本对称。额叶皮质损害大鼠损害侧δ、θ频段相对功率值较健例显著增高（Ｐ＜０．０５），α、β段相对功率值较健侧显著降低（Ｐ＜０．０５）；ＤＴ／ＡＢ值较健侧显著增加（Ｐ＜０．０５），功率谱曲线两侧明显不对称。额叶皮质损害后３天、２周、４用及８周功率谱分析结果无明显不同。形态学观察证实额叶皮质存在缺损区不因时间延长而自行修复．额叶皮质损害出现的脑功能障碍及损害区形态变化均不能自行修复，表明功能效应和形态结果相一致，提示脑电功率谱分析可作为临床和实验研究中评价脑功能的有效手段。

EEG POWER SPECTRAL ANALYSIS AND MORPHOLOGICAL STUDY IN FRONTAL CORTEX LESIONED RATS

EEG power spectral analyses were studied in 35 rats. The animals were divided into three groups: normal rats, sham lesioned rats and lesioned rats. The lesioned models were made by gentle aspiration at the right frontal cortex. The results showed that in normal rats and sham lesioned rats, the relative power of two hemispheres in δ, θ, α,β bands were similar,the values of (δ+θ) /(α+β) (DT/AB) were similar, too. The power spectral curves were symmetrical on both sides. In lesioned rats, the relative power of the lesioned sides were significantly increased in δ and θ bands and significantly decreased in α and β bands than those of the healthy sides. The DT/AB values of the lesioned sides were significantly higher than those of the healthy sides. The power spectral curves in lesioned sides and healthy sides were asymmetrical. The power spectral analyses were not different among 3 days, 2 weeks, 4 weeks and 2 months lesioned rats. The morphological observation revealed that the lesioned cortex were not restored automatically The results indicated that the functional effects were in accordance with the morphological observation and suggested that power spectral analysis may be a good method for investigating the function of brain either in lab or in clinic.