弱视儿童的MRI全脑皮层厚度分析

目的 利用皮层厚度分析技术探讨弱视患儿脑灰质发育的异常.方法 对11例弱视患儿和10名视力正常儿童行3D T1WI扫描,数据应用Freesurfer软件进行后处理,以双样本独立t检验进行病例组和对照组的全脑皮层厚度比较,将具有统计学意义(P<0.05)的像素在标准脑模板上生成伪彩图.选取像素阈值为500个相邻像素,分析弱视患者皮层厚度改变的区域.结果 弱视组在双侧中央前回、左侧距状回前部、左侧颞上回和右侧额中回、额上回皮层厚度大于对照组;而在双侧舌回、枕颞外侧回、顶上小叶的区域,对照组皮层厚度大于弱视组.结论 皮层厚度分析研究能够发现弱视患儿与视觉相关的大脑区域的灰质皮层发育异常,从而为探讨弱视相关的神经结构发育异常提供有用信息.

Measuring the cortical thickness with MRI in children with amblyopia

Objective To investigate changes of the grey matter in children with amblyopia by measuring the cortical thickness across the entire brain. Methods Eleven children with amblyopia and 10 normally-sighted children underwent 3D T1WI scanning. The original 3D T1 brain images were analyzed with Freesurfer software package. Comparison between amblyopic group and control group was derived using parametric statistics. The abnormal regions of the cortical thickness in patients with amblyopia were revealed. Results Cortical thickness in bilateral precentral gyri, left calcarine cortices, left superior temporal gyrus, right superior frontal gyrus and middle frontal gyrus of amblyopic group increased compared with control group. In bilateral superior parietal lobules, lingual gyri and lateral occipital-temporal junction, the cortical thickness of control group were significantly more than those of amblyopic group. Conclusion Developmental changes in the cortices related to visual function in children with amblyopia can be detected using cortical thickness analysis of the whole brain. The findings are helpful in the investigation of the development of the brain with amblyopia.