次声作用对CHO细胞膜的影响

目的应用原子力显微镜对经次声作用后的CHO细胞膜进行观察，以探讨次声对细胞膜超微结构的影响。方法采用8Hz、130dB的次声作用于CHO细胞，并利用原子力显微镜对正常及经次声作用后的CHO细胞膜表面进行纳米级水平的扫描检测。结果CH0细胞经次声作用后，其细胞膜表面突起明显变短、凹陷变浅，整个细胞膜表面结构变得较为平缓，并且随着次声作用次数的增加，其改变程度亦愈加显著。结论一定强度的次声作用可引起细胞膜表面超微结构的直接改变，并且次声作用次数越多，该变化就越显著。

Atomic force microscope observation of the CHO cell membrane after infrasound exposure

Objective To observe the changes of Chinese hamster ovary (CHO) cell membrane under atomic force microscope (AFM) after infrasound exposure. Methods After primary culture, the CHO cells were exposed to infrasound with the intensity of 130dB and frequency of 8Hz to observe the subsequent changes in the membrane of the cells by nano-scale scanning with AFM. Results It was shown that the prominence of the membrane became short and excavation became shallow after exposure to the infrasound, and the surface of the membrane became smooth. As the infrasound exposure increased, the changes of the membrane became more prominent. Conclusion It suggested that the structure of the membrane of CHO cells could be changed by infrasound exposure with intensity of 130dB and frequency of 8Hz.